@InBook{Zander2009,
  author    = {Justyna Zander and Ina Kathrin Schieferdecker},
  booktitle = {Behavioral Modeling for Embedded Systems and Technologies},
  title     = {Model-Based Testing of Embedded Systems Exemplified for the Automotive Domain},
  doi       = {10.4018/978-1-60566-750-8.ch015},
  pages     = {377--413},
  publisher = {{IGI} Global},
  abstract  = {The purpose of this chapter is to introduce the test methods applied for embedded systems addressing selected problems in the automotive domain. Model-based test approaches are reviewed and categorized. Weak points are identified and a novel test method is proposed. It is called model-in-the-loop for embedded system test (MiLEST) and is realized in MATLAB®/Simulink®/Stateflow® environment. Its main contribution refers to functional black-box testing based on the system and test models. It is contrasted with the test methods currently applied in the industry that form dedicated solutions, usually specialized in a concrete testing context. The developed signal-feature-oriented paradigm developed herewith allows the abstract description of signals and their properties. It addresses the problem of missing reference signal flows and allows for a systematic and automatic test data selection. Processing of both discrete and continuous signals is possible, so that the hybrid behavior of embedded systems can be handled.},
  file      = {:2009/Zander2009 - Model Based Testing of Embedded Systems Exemplified for the Automotive Domain.pdf:PDF},
  type      = {inbook},
  year      = {2009}
}